E/H (Ta2N) (Military M/D55342) QPL MIL-PRF-55342 Qualified Ta2N Thin Film Resistor, Surface Mount Chip
技术特性
- Established reliability, “R” failure rate level (0.01 % per 1000 h), C = 2
- High purity alumina substrate
- Wraparound termination featuring a tenacious adhesion layer covered with an electroplated nickel barrier layer for +150 °C operating conditions
Datasheet
General Information
- Land Patterns - Vishay Dale Thin Film Land Patterns
Product Literature
- Product Sheet - E/H - Tantalum Nitride QPL Qualified Precision Thin Film Resistor
- Selector Guide - Military and Aerospace Applications
