Design Overview for moduletest

PropertyValue
Project Name:c:\data\xapp000-mbt\483test_v1.5_din_pattern2_speedup_working_modulized\483test2
Target Device:xc3s500e
Report Generated:Wednesday 01/04/06 at 15:29
Printable Summary (View as HTML)moduletest_summary.html

Device Utilization Summary (estimated values)

Logic UtilizationUsedAvailableUtilizationNote(s)
Number of Slices:7546561% 
Number of Slice Flip Flops:6593120% 
Number of 4 input LUTs:8793120% 
Number of bonded IOBs:142326% 
Number of GCLKs:1244% 

Performance Summary

PropertyValue
Data Not Yet Available  

Failing Constraints

Constraint(s)RequestedActualLogic Levels
Data Not Yet Available   

Detailed Reports

Report NameStatusLast Date Modified
Synthesis ReportCurrentWednesday 01/04/06 at 15:29