NCP170AMX120GEVB: Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board

The NCP170AMX120GEVB evaluation board is designed to quickly test the NCP170, a series of CMOS low dropout regulators are designed specifically for portable battery-powered applications which require ultra-low quiescent current. The ultra-low consumption of type 500nA ensures long battery life and dynamic transient boost feature improves device transient response for wireless communication applications.

Evaluation/Development Tool Information
ProductStatusComplianceShort DescriptionParts Used
NCP170AMX120GEVBActivePb-freeUltra Low IQ 150mA CMOS LDO Regulator Evaluation BoardNCP170BMX120TCG
Technical Documents
TypeDocument TitleDocument ID/SizeRev
Eval Board: BOMNCP170AMX120GEVB Bill of Materials ROHS CompliantNCP170AMX120GEVB_BOM_ROHS.pdf - 15 KB0
Eval Board: GerberNCP170AMX120GEVB Gerber Layout Files (Zip Format)NCP170AMX120GEVB_GERBER.zip - 37 KB0
Eval Board: SchematicNCP170AMX120GEVB SchematicNCP170AMX120GEVB_SCHEMATIC.pdf - 50 KB0
Eval Board: Test ProcedureNCP170AMX120GEVB Test ProcedureNCP170AMX120GEVB_TEST_PROCEDURE.pdf - 36 KB0
VideoUltra‐Low IQ 150 mA CMOS LDO Regulator Evaluation Boards - NCP170WVD17574/D
NCP170AMX120GEVB BOM ROHS NCP170AMX120GEVB
NCP170AMX120GEVB GERBER NCP170AMX120GEVB
NCP170AMX120GEVB SCHEMATIC NCP170AMX120GEVB
NCP170AMX120GEVB TEST PROCEDURE NCP170AMX120GEVB