NCP170AMX180GEVB: Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board
The NCP170AMX180GEVB evaluation board is designed to quickly test the NCP170, a series of CMOS low dropout regulators are designed specifically for portable battery-powered applications which require ultra-low quiescent current. The ultra-low consumption of type 500nA ensures long battery life and dynamic transient boost feature improves device transient response for wireless communication applications.
Evaluation/Development Tool Information
| Product | Status | Compliance | Short Description | Parts Used |
|---|---|---|---|---|
| NCP170AMX180GEVB | Active | Pb-free | Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board | NCP170BMX180TCG |
Technical Documents
| Type | Document Title | Document ID/Size | Rev |
|---|---|---|---|
| Eval Board: BOM | NCP170AMX180GEVB Bill of Materials ROHS Compliant | NCP170AMX180GEVB_BOM_ROHS.pdf - 15 KB | 0 |
| Eval Board: Gerber | NCP170AMX180GEVB Gerber Layout Files (Zip Format) | NCP170AMX180GEVB_GERBER.zip - 36 KB | 0 |
| Eval Board: Schematic | NCP170AMX180GEVB Schematic | NCP170AMX180GEVB_SCHEMATIC.pdf - 50 KB | 0 |
| Eval Board: Test Procedure | NCP170AMX180GEVB Test Procedure | NCP170AMX180GEVB_TEST_PROCEDURE.pdf - 36 KB | 0 |
| Video | Ultra‐Low IQ 150 mA CMOS LDO Regulator Evaluation Boards - NCP170 | WVD17574/D |
- NCP170AMX180GEVB BOM ROHS NCP170AMX180GEVB
- NCP170AMX180GEVB GERBER NCP170AMX180GEVB
- NCP170AMX180GEVB SCHEMATIC NCP170AMX180GEVB
- NCP170AMX180GEVB TEST PROCEDURE NCP170AMX180GEVB
