NCP170AXV180GEVB: Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board

The NCP170AXV180GEVB evaluation board is designed to quickly test the NCP170, a series of CMOS low dropout regulators are designed specifically for portable battery-powered applications which require ultra-low quiescent current. The ultra-low consumption of type 500nA ensures long battery life and dynamic transient boost feature improves device transient response for wireless communication applications.

Evaluation/Development Tool Information
ProductStatusComplianceShort DescriptionParts Used
NCP170AXV180GEVBActivePb-freeUltra Low IQ 150mA CMOS LDO Regulator Evaluation BoardNCP170BXV180T2G
Technical Documents
TypeDocument TitleDocument ID/SizeRev
Eval Board: BOMNCP170AXV180GEVB Bill of Materials ROHS CompliantNCP170AXV180GEVB_BOM_ROHS.pdf - 15 KB0
Eval Board: GerberNCP170AXV180GEVB Gerber Layout Files (Zip Format)NCP170AXV180GEVB_GERBER.zip - 32 KB0
Eval Board: SchematicNCP170AXV180GEVB SchematicNCP170AXV180GEVB_SCHEMATIC.pdf - 54 KB0
Eval Board: Test ProcedureNCP170AXV180GEVB Test ProcedureNCP170AXV180GEVB_TEST_PROCEDURE.pdf - 37 KB0
VideoUltra‐Low IQ 150 mA CMOS LDO Regulator Evaluation Boards - NCP170WVD17574/D
NCP170AXV180GEVB BOM ROHS NCP170AXV180GEVB
NCP170AXV180GEVB GERBER NCP170AXV180GEVB
NCP170AXV180GEVB SCHEMATIC NCP170AXV180GEVB
NCP170AXV180GEVB TEST PROCEDURE NCP170AXV180GEVB